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產(chǎn)品描述：

FISCHERSCOPE X-RAY XDV-SD X射線熒光光譜儀

技術(shù)參數(shù)

	FISCHERSCOPE^® X-RAY XAN^®	FISCHERSCOPE^® X-RAY XDAL	FISCHERSCOPE^® X-RAY XDV^®-SD
測量方向	從下到上	從上到下	從上到下
X射線管為微聚焦管，帶鈹窗口
高壓可調(diào)：10kV；30kV；50 kV
開槽測量室
準(zhǔn)直器個數(shù)：4
Z軸	無	可編程	可編程
測試臺類型	固定工作臺	可編程XY工作臺	可編程XY工作臺
測試點(diǎn)放大倍數(shù)	34 －184倍	20 －180倍	20 －180倍
WinFTM^® 版本	V6：基本型，帶PDM WinFTM^® Super可選	V6：基本型，帶PDM WinFTM^® Super可選	V6：基本型，帶PDM WinFTM^® Super可選
操作系統(tǒng)：Windows^® XP專業(yè)版
Amount of primary filters	2	2	6
Digital pulse processor	optional		standard

Description：

Are your products RoHS-compliant? Are you receiving the amount of gold that you paid for? Is your electroplating process cost-effective and yet still reliable?

If you are unsure on any of these questions, then the FISCHERSCOPE^® X-RAY XDV^®-SD is your right choice!

This instrument was especially developed for the challenging tasks of RoHS/ WEEE analyses.
Furthermore, it is ideally suited for measurements of gold and other precious metals with a repeatability of gold analyses of up to 0,5 ?
For coatings: Not only their consistence can be measured, but also their thickness!

The FISCHERSCOPE^® X-RAY XDV^®-SD is a really versatile alround-talent!

RoHS / WEEE

Very reliable measurement of Pb, Hg, Cd, Br and Cr. The achievable detection limits are 2 ppm for Pb, and 10 ppm for Cd in plastics material. The RoHS / WEEE limit values of 1000 ppm (Pb) and 100 ppm (Cd) can be verified reliably. Plastic samples can be analyzed correctly regardless of their thickness. Even small electronic components or coating systems on printed conductors are analyzed with pin-point precision.

The XY(Z) stage allows for automatic scanning of pc-boards, for example.

The Software WinFTM^® V.6 BASIC

Up to 24 individual characteristic values of a sample with regard to coating thickness and element concentration can be determined simultaneously during one measurement. Very thin coatings down into the 10-nanometer range can be measured. Most often, complex multi-coating systems can be analyzed standard-free (without calibration) with great accuracy. The measurement accuracy can be raised to a maximum by using up to 64 calibration standards per application. This also ensures the traceability of the measurement results. DKD calibration certificates according to DIN EN ISO/IEC 17025 can be issued for many X-RAY calibration standards.

The WinFTM^® V.6 software enables very accurate results for materials analysis over a concentration range from a few ppm to 100 %.

技術(shù)參數(shù)：